Microscopy - ELHYPORT
Microscopic characterization
- Samples preparation laboratory
- Cross sections of electrodes and MEAs: embedded-mechanical polishing, ion milling (Hitachi High Tech IM4000), and other techniques (lasser cutting, N2 cut).
- FE-SEM microscope (Hitachi SU6600)
SEM microscopy and cross-sectional analysis
Cross section SEM image of an MEA