Electrical characterization system

Electrical characterization system

Electrical characterization system: experimental bench that allows measuring the current-voltage (J-V) characteristics of semiconductor devices, both in darkness and under simulated solar illumination.

Plasma-Enhanced Chemical Vapour Deposition plant

Plasma-Enhanced Chemical Vapour Deposition plant

Plasma-Enhanced Chemical Vapour Deposition plant (PECVD), valid for substrates up to 15x15 cm2, suitable for the deposition of different amorphous (a Si:X:H) and microcrystalline silicon (µc-Si:X:H) alloys.

Optical and IR characterization system

Optical and IR characterization system

Optical and IR characterization system composed of two commercial spectrophotometers: one for UV/Vis/NIR and another for FTIR.

Laser-beam induced current measurement system

Laser-beam induced current measurement system

Laser-beam induced current measurement system (LBIC): experimental bench in which both, the uniformity of the optoelectronic response of devices by LBIC at two wavelengths, as well as the uniformity of thin sheets by optical transmission with white light, can be measured.

Magnetron-type sputtering plant

Magnetron-type sputtering plant

Magnetron-type sputtering plant (DC and RF) in which thin sheets of metal (Al, Ti, W, etc.), oxides (AZO, ITO, TiO2, etc.) and other materials (such as LiF) can be deposited onto substrates up to 1515 cm2.

Optoelectronic characterization system

Optoelectronic characterization system

Optoelectronic characterization system: experimental bench for measuring the spectral response of devices.

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Thermal evaporation plant

Thermal evaporation plant

Thermal evaporation plant used for the deposition of metallic contacts for the electrical characterization of films and devices.

Electrical characterization system

Electrical characterization system

Electrical characterization system: experimental bench that allows measuring the current-voltage (J-V) characteristics of semiconductor devices, both in darkness and under simulated solar illumination.

Measurement system for photocurrents

Measurement system for photocurrents

Measurement system for photocurrents in quasi-stationary state (QSSPC) and SUNS-VOC. Commercial equipment by Sinton instruments that allows measuring: a) the minority carrier lifetime of crystalline silicon wafers, as well as the implicit open circuit voltage; and b) the SUNS-VOC and JSC-VOC characteristics of solar cells.